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Preparation and characterization of coatings with a high reflectivity on planar substrates and inside silica tubes

机译:在平面基材和二氧化硅管内部的高反射率涂层的制备和表征

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The paper presents results on preparation and characterization of highly reflective coatings on planar substrates and inside silica tubes. Coatings are designed for a maximum reflectivity at a wavelength of 550 nm and consist of several pairs of oxide layers. Each pair is composed of one layer with a high refractive index and one layer with a low refractive index with a refractive-index contrast of about 1.1. The layers were prepared by the sol-gel method. High-index layers were applied from a sol based on titanium butoxide while a sol of tetramethoxysilane was use for low-index layers. The sols were deposited onto silica slides or onto walls of silica tubes by using the dip-coating technique. Applied gel layers were thermally treated at temperatures up to 450 ℃ in order to obtain densified layers with thicknesses 50-100 nm. Coatings with one to five pairs of layers were fabricated. Prepared coatings were characterized by transmission and reflection spectrometry in a wavelength range from 190 to-1100 nm, by contact profilometry, and by spectral ellipsometry. Thicknesses and refractive indices of coatings were determined from these measurements. For normal light incidence a reflectivity higher than 99% in a wavelength range of 500-650 nm was measured by transmission spectrometry on coatings prepared from four or five pairs of layers. Similar reflectivity values were determined for angles of incidence of 15, 30, 45 and 60 degrees by using reflection spectrometry. Transmission spectra measured on the coated tubes which show interference bands are also presented in the paper.
机译:本文介绍了在平面基板和二氧化硅管内部的高反射涂层的制备和表征的结果。涂层设计为在550 nm波长处具有最大反射率,并且由几对氧化层组成。每对由折射率高的一层和折射率低的约1.1的低折射率的层构成。这些层通过溶胶-凝胶法制备。高折射率层是由基于丁氧基钛的溶胶施加的,而四甲氧基硅烷的溶胶则用于低折射率层。通过使用浸涂技术将溶胶沉积在二氧化硅载玻片上或二氧化硅管壁上。在最高450℃的温度下对涂覆的凝胶层进行热处理,以获得厚度为50-100 nm的致密层。制备具有1-5对层的涂层。通过在190至-1100nm的波长范围内的透射和反射光谱,通过接触轮廓光度法和通过光谱椭圆光度法来表征所制备的涂层。由这些测量值确定涂层的厚度和折射率。对于正常的光入射,通过透射光谱法在由四对或五对层制备的涂层上测量了在500-650 nm波长范围内高于99%的反射率。通过使用反射光谱法,对于15、30、45和60度的入射角确定了相似的反射率值。本文还介绍了在涂层管上测得的显示出干涉带的透射光谱。

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