首页> 外文会议>PCIC Europe, 2009. PCIC EUROPE '09 >Essential changes in the product standard for low voltage MCC and switchgear
【24h】

Essential changes in the product standard for low voltage MCC and switchgear

机译:低压MCC和开关柜产品标准的重要变更

获取原文

摘要

Since the main objective of a product standard is to ensure the safety of the equipment during its operational life, new editions of such a standard are expected to advance the general safety. This is done by adding requirements where the former standard ran short and by narrowing down the ways to interpret the text in order to make the specified properties of assemblies from different manufacturers comparable. The restructuring of the former document, IEC60439-1, started in 1999. While the interpretation of TTA was stretched by manufactures in a way that is hard to recognise for the user, the committee decided to abandon the terms TTA and PTTA. In general, type testing is replaced by design verification. Particularly for temperature rise testing it implemented exact ways for temperature rise verification three new methods are developed: testing with current; derivation (from a tested design) of ratings for similar variants; calculation. This paper gives a qualitative overview of the improvements of the new IEC 61439-1 and -2 that has been published beginning this year, compared to the former standard. The new 61439 series is intended to be extended with a specifiers guide to enable the user to make a comprehensive specification of the switchgear he requires. To cover also internal arcing the in 2008 published technical report for testing under conditions of internal arcing, document IEC/TR 61641, is als incorporated in this paper.
机译:由于产品标准的主要目的是确保设备在其使用寿命内的安全性,因此有望通过新版本的标准提高总体安全性。这是通过在以前的标准不足的地方增加要求并缩小解释文本的方式来实现的,以使来自不同制造商的组件的指定属性具有可比性。先前的文件IEC60439-1的重组工作始于1999年。尽管制造商对TTA的解释进行了扩展,以至于用户难以识别,但委员会决定放弃TTA和PTTA。通常,类型测试由设计验证代替。特别是对于温升测试,它采用了精确的温升验证方法,开发了三种新方法:电流测试; (从经过测试的设计得出)类似型号的额定值;计算。本文对定于今年开始发布的新IEC 61439-1和-2与旧标准相比的改进进行了定性概述。新的61439系列旨在通过规格说明指南进行扩展,以使用户能够对所需的开关设备进行全面的规格说明。为了涵盖内部电弧,本文中还纳入了2008年发布的用于在内部电弧条件下进行测试的技术报告,文件IEC / TR 61641。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号