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Effects of substrate etching on laser-induced damage of 355nm space coatings

机译:基板蚀刻对355nm空间涂层激光诱导损伤的影响

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摘要

Abstract: 355nm UV lidars are of high spectral resolution and are demanded in space-borne applications. As a result of the vulnerability of the coatings in the laser systems and coatings irradiated by 355nm UV laser are more prone to be damaged than visible or infrared lasers. Thus, the study of the processing on substrate surface will contribute to the improvement of the performance of optical coatings. The dual ion beam sputtering can provide compact and stable layers for space applications. Thus, Al_2O_3/SiO_2 high reflection(HR) and anti-reflection(AR) coatings deposited on acid etched substrate were prepared by dual ion beam sputtering. Damage characteristics on the surface were analyzed after 355nm laser irradiation on the coatings. The damage morphology measured by focused ion beam-field emission scanning electron microscopy (FIB-FESEM) and depth measurement of damage pits hint that the damage of HR coatings occurs in the coating layers rather than the substrate. The HR and AR coatings deposited on acid etched substrate are of larger changes on laser-mduced damage thresholds(LIDT) than these on the non-etched substrate. The damage mechanisms of coatings are attributed to thermal absorption and the damage area is a molten pool surrounded by mechanical ejection. The etched area with nicks caused the damage on the HR coatings deposited on etched substrate. And due to the elimination of defects on the subsurface of the AR coatings by etching method, the LIDT of AR coatings was improved.
机译:摘要:355nm UV激光雷达具有高光谱分辨率,在航天应用中需要。由于激光系统中涂层的脆弱性,与可见光或红外激光相比,355nm UV激光辐照的涂层更容易受到损坏。因此,对基材表面处理的研究将有助于改善光学涂层的性能。双离子束溅射可以为空间应用提供紧凑而稳定的层。因此,通过双离子束溅射制备了沉积在酸蚀基体上的Al_2O_3 / SiO_2高反射(HR)和抗反射(AR)涂层。在355nm激光辐照涂层后,分析表面的损伤特性。通过聚焦离子束场发射扫描电子显微镜(FIB-FESEM)测量的损伤形态和损伤坑的深度测量表明,HR涂层的损伤发生在涂层而不是基材中。沉积在酸蚀基材上的HR和AR涂层在激光诱导损伤阈值(LIDT)上的变化要比未腐蚀基材上的大。涂层的损坏机理归因于热吸收,损坏区域是被机械喷射包围的熔池。具有刻痕的刻蚀区域对沉积在刻蚀基板上的HR涂层造成损坏。并且由于通过蚀刻方法消除了AR涂层的亚表面上的缺陷,所以改进了AR涂层的LIDT。

著录项

  • 来源
  • 会议地点 Shanghai(CN)
  • 作者单位

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China,University of Chinese Academy of Sciences, Beijing 100049, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China,School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China,University of Chinese Academy of Sciences, Beijing 100049, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;

    Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    substrate etching; damage threshold; 355nm coatings; space;

    机译:基板蚀刻;损害阈值; 355nm涂层;空间;

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