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Non-contact metrology of aspheres and windows of large departure

机译:非球面和大偏离窗口的非接触式计量

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摘要

The measurement of large departure aspheres and windows is a challenge for the optics community. OptiPro systems has developed a non-contact measuring system called UltraSurf to overcome these difficulties. The UltraSurf system utilizes a single point non-contact sensor coupled with high accuracy air bearings to scan optical surfaces. Five air bearing axes allow for the optical probe to maintain normal angles with the surface under test, and provide a smooth and accurate scan. The axes of motion allow scanning of rotationally symmetric parts such as spheres and aspheres, but also give it the freedom to perform areal surface scanning and freeform metrology. By maintaining a tangent angle with the surface, this technique allows for large surface slopes and deviation from best fit sphere to easily be measured. Several commercial non-contact sensors have been integrated into UltraSurf. The sensors operate with different optical principles, allowing for greater flexibility of the types of surfaces to be measured. One sensor applies white-light confocal chromatic aberration for high resolution, single surface measurement. Another sensor that uses low-coherence interferometry with a 1310 nanometer light source is able to see through materials, enabling multiple surface and thickness measurements simultaneously. Measurement of large departure aspheres and windows will be demonstrated. Cross comparison of UltraSurf data with current metrology techniques will be shown on surfaces that can be measured with multiple methods.
机译:大型离球非球面和窗口的测量对于光学界是一个挑战。 OptiPro系统已开发出一种称为UltraSurf的非接触式测量系统,以克服这些困难。 UltraSurf系统利用单点非接触式传感器与高精度空气轴承相结合来扫描光学表面。五个空气轴承轴可使光学探头与被测表面保持法线角度,并提供平滑而准确的扫描。运动轴允许扫描旋转对称的零件(例如球和非球面),但也使它可以自由地执行平面扫描和自由形式的度量。通过保持与表面的切线角,此技术可以轻松测量大的表面斜率和与最佳拟合球的偏差。几种商用非接触式传感器已集成到UltraSurf中。传感器以不同的光学原理工作,从而使要测量的表面类型具有更大的灵活性。一个传感器应用白光共焦色差,可实现高分辨率的单面测量。另一个使用低相干干涉仪和1310纳米光源的传感器能​​够透视材料,从而可以同时进行多个表面和厚度测量。将演示大型离球非球面和窗户的测量。 UltraSurf数据与当前计量技术的交叉比较将显示在可以用多种方法测量的表面上。

著录项

  • 来源
    《Optical manufacturing and testing X》|2013年|883809.1-883809.8|共8页
  • 会议地点 San Diego CA(US)
  • 作者

    Scott DeFisher; Edward Fess;

  • 作者单位

    OptiPro Systems, 6368 Dean Parkway, Ontario, NY 14519;

    OptiPro Systems, 6368 Dean Parkway, Ontario, NY 14519;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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