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Phase detection from two phase-shifting interferograms

机译:从两个相移干涉图中进行相位检测

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摘要

Phase detection is one of the most important processing steps in optical phase-shifting interferometry. It aims to reconstruct the phase field of wavefront from the interferogram. To solve this problem, many algorithms of phase detection have been proposed these years. Here, A FFT-based two-step phase shifting (TPS) algorithm is described in detail and implemented by use of experimental interferograms. This algorithm has been proposed to solve the TPS problem with random phase shift except n. By comparison with the Visibility-Function-based TPS algorithm, it provesthat the FFT-based algorithm has obvious advantages in phase extracting. Meanwhile, we present a 7r-phase-shiftsupplement to the TPS algorithm, which combines the two interferograms and demodulates the phase map from a combined interferogram. So combining this quasi-two-step method and FFT-based one, one could really implement the TPS with random phase shift. Thereafter, we design an optical setup of two-channel TPS interferometer with random phase shift, which could capture the two interferograms simultaneously. At the same time, we propose a fringe-variable Jamin interferometer to detect reversed domain of ferroelectric crystal in real time. It could realize the two-step phase shifting with π radian.
机译:相位检测是光学相移干涉术中最重要的处理步骤之一。目的是从干涉图重建波前的相场。为了解决这个问题,近年来已经提出了许多相位检测算法。在此,对基于FFT的两步相移(TPS)算法进行了详细说明,并通过实验干涉图来实现。已经提出了该算法来解决除n以外具有随机相移的TPS问题。通过与基于可见性函数的TPS算法相比较,证明了基于FFT的算法在相位提取中具有明显的优势。同时,我们向TPS算法提出了7r相移补充,该算法结合了两个干涉图并从组合干涉图中解调出相位图。因此,将这种准两步法与基于FFT的方法相结合,可以真正实现具有随机相移的TPS。此后,我们设计了具有随机相移的两通道TPS干涉仪的光学装置,该光学装置可以同时捕获两个干涉图。同时,我们提出了一种条纹可变的贾明干涉仪来实时检测铁电晶体的反向畴。利用π弧度可以实现两步相移。

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