首页> 外文会议>Optical Manufacturing and Testing VII; Proceedings of SPIE-The International Society for Optical Engineering; vol.6671 >Correction of high spatial frequency errors on optical surfaces by means of Ion Beam Figuring
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Correction of high spatial frequency errors on optical surfaces by means of Ion Beam Figuring

机译:通过离子束刻蚀校正光学表面的高空间频率误差

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The Ion Beam Figuring is a well known technique able to correct shape errors on optical surfaces with high accuracy. The size of the ion beam dictates strongly the higher spatial frequencies that can be corrected on the optical surface. The correction of small optics of some cm in diameter or containing high spatial frequencies can be very time consuming or impossible. A system that permits the Ion Beam Figuring of small optical components has been developed in the Astronomical Observatory of Brera (INAF-OAB). It has a small ion beam size and large removal rate. The system employs a concentrator able to force the broader beam emitted from an ion source into a smaller spot having large removal rate. The concentrator is placed between the ion source and the optical surface to be figured and doesn't influence the long term stability of the source. It consists of a conical cavity in which is injected the beam extracted from the grids of the source. The grazing incidence angle of impact of the ions with the walls of the cone ensure a very low level of sputtering of the cone material and meanwhile permits the creation of a very small spot removal function having large removal rate. To demonstrate its functionality a number of test optics has been figured using this system with very good results.
机译:离子束刻蚀是一种众所周知的技术,能够高精度地校正光学表面上的形状误差。离子束的大小强烈指示了可以在光学表面上校正的较高空间频率。直径约几厘米或包含高空间频率的小型光学器件的校正可能非常耗时或不可能。布雷拉天文台(INAF-OAB)已开发出一种允许对小型光学部件进行离子束计算的系统。它具有较小的离子束尺寸和较大的去除率。该系统采用了一种聚光器,该聚光器能够将离子源发出的较宽的光束压入具有较大去除率的较小光点。集中器放置在离子源和要计算的光学表面之间,不会影响离子源的长期稳定性。它由一个锥形腔组成,从光源的栅格中提取的光束被注入其中。离子与锥体壁的碰撞掠入入射角确保了锥体材料的非常低的溅射水平,同时允许产生具有大去除速率的非常小的斑点去除功能。为了证明其功能,已经使用该系统找到了许多测试光学器件,并取得了很好的效果。

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