首页> 外文会议>Networks, 1999. (ICON '99) Proceedings >Breakdown phenomena in power integrated packages
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Breakdown phenomena in power integrated packages

机译:功率集成封装中的击穿现象

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Tests have been performed on a test pattern designed to study theneffects of applying voltage to the inside of the package. The need tonapply high voltage to the internal connections of the package, withoutndischarges occurring outside the package, has led to the design of anmetal frame having only two leads spaced 16 mm apart. Specimens havingnthree different distances between the bonding pads (60 μm, 100 μm,nand 160 μm) have been prepared. Test patterns for the three kindsnhave been subjected to breakdown tests by applying an increasing 50 Hznvoltage. No meaningful breakdown voltage (BDV) difference appearednbetween the results for each test set, demonstrating that the dischargesnoccur not in the encapsulant, but through the passivation layer.nConsequently, new test patterns having a double thickness oxide layernhave been manufactured in order to stress the encapsulant with a highernfield strength. The discharge test results have shown increased valuesnof BDV, yet no meaningful differences between the BDV of each set havenbeen found, indicating that the discharge path was through the oxidenlayer even with a double layer. The results support the possibility ofnimplementing power plastic packages which work at higher than usualnvoltage by modifying the metal frame
机译:已经对设计用于研究向封装内部施加电压的效果的测试图案进行了测试。在封装内部连接上需要施加高电压而在封装外部不产生放电的需求导致了金属框架的设计,该框架仅具有两个间隔16 mm的引线。已经准备了在焊盘之间具有三种不同距离(60μm,100μm,n和160μm)的样品。通过施加增加的50 Hzn电压,已对这三种测试模式进行了击穿测试。在每个测试组的结果之间没有出现有意义的击穿电压(BDV)差异,这表明放电不是在密封剂中发生,而是通过钝化层。n因此,为了使密封剂受力,已经制造了具有双层氧化层的新测试图案。具有更高的场强放电测试结果表明BDV的值增加了,但是在每组的BDV之间没有发现有意义的差异,这表明放电路径是穿过氧化层,甚至是双层。结果支持通过修改金属框架来实现功率塑料封装的可能性,该塑料封装的工作电压高于通常的电压

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