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Non-Langevin recombination in disordered dielectrics

机译:无兰氏蛋白在无序电介质中的重组

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Summary form only given. Negative transient RIC (radiation-inducednconductivity) in short-circuited samples and nonmonotonic increase ofnradiation-induced space-charge density have recently been observed fornpolymers (low-density polyethylene, polytetrafluoroethylene) andninorganic dielectrics (MgO, CaF2, AlN, LiNiO3).nThese experimental data are analyzed, and it is shown that such anbehavior of RIC and space-charge density can be caused by non-Langevinnrecombination with the recombination constant R smaller thannthe Langevin value Ro. Possible mechanisms ofnrecombination rate reduction have been considered
机译:仅提供摘要表格。最近,在高分子材料(低密度聚乙烯,聚四氟乙烯)和无机介电材料(MgO,CaF 2 ,AlN,LiNiO 3 )。n这些实验数据进行了分析,结果表明,这种RIC和空间电荷密度的行为可能是由非朗格维宁重组引起的,其重组常数 R < / e1>小于Langevin值 R o 。已经考虑了降低重组率的可能机制

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