In-situ Gas Injection-Heating Atomic Resolution TEM for Nanomaterials

摘要

In-situ gas environmental transmission electron microscopy (E-TEM) capability was developed based on a Hitachi 300 kV high-resolution transmission electron microscope (H-9500) combined with a Hitachi gas injection-heating sample holder. This simple but high performance system allows for in-situ TEM dynamic observation and chemical analysis of nanomaterials at elevated temperatures with gas environment, and most importantly on an atomic resolution. Various nanomaterials were studied to reveal their structural responses at high temperatures under gaseous conditions. The development of this atomic resolution, in-situ gas-heating TEM system offers an affordable platform for a broad range of user facilities in academic and industry fields to perform gas-solid interaction studies.