A fast and efficient microwave method for detecting dielectric and conducting bodies inside complex structures

摘要

This contribution presents a fast and efficient method for the inspection of dielectric and conducting bodies located inside arbitrary structures by using microwaves. The presented procedure is able to retrieve both the dielectric permittivity and electric conductivity of arbitrarily shaped targets embedded in inhomogeneous backgrounds and so it is an useful tool for diagnostics in several scenarios. The applications which can mostly benefit from it are non-destructive testing and evaluation of products and the imaging of objects hidden in bags or suitcases.