Low-Overvoltage Microanalysis: an Alternative High Resolution Strategy toLow-Voltage Microanalysis

机译：低过压微分析：低压微分析的替代高分辨率策略

获取原文

页面导航

著录项
相似文献
相关主题

著录项

来源
《Microscopy Society of America annual meeting;Microscopy Society of Canada annual meeting;Societe de Microscopie du Canada annual meeting;Microbeam Analysis Society annual meeting;International Metallographic Society annual meeting》|2002年|1-2|共2页
会议地点 Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA)
作者
Dale E. Newbury;
展开▼
作者单位

National Institute of Standards and Technology Gaithersburg MD 20899-8371;

展开▼
会议组织
原文格式 PDF
正文语种
中图分类
关键词

相似文献

外文文献
中文文献
专利

1. Alternative matrix formers for nanosuspension solidification: Dissolution performance and X-ray microanalysis as an evaluation tool for powder dispersion. [J] . Van-Eerdenbrugh B, Froyen L, Van-Humbeeck J, European journal of pharmaceutical sciences . 2008,第4期

机译：用于纳米悬浮液固化的替代基质形成剂：溶解性能和X射线微分析作为粉末分散的评估工具。
2. High resolution scanning microanalysis on material surfaces using UV femtosecond laser induced breakdown spectroscopy [J] . Banerjee S. P., Chen Z., Fedosejevs R. Optics and Lasers in Engineering . 2015,第may期

机译：紫外飞秒激光诱导击穿光谱技术对材料表面进行高分辨率扫描微分析
3. Combination of high spatial resolution and low minimum detection limit using thinned specimens in cutting-edge electron probe microanalysis [J] . Kubo Yugo, Hamada Kotaro Ultramicroscopy . 2015,第Null期

机译：尖端电子探针显微分析中使用稀薄样品的高空间分辨率和最低检测限低的组合
4. Low-Overvoltage Microanalysis: an Alternative High Resolution Strategy toLow-Voltage Microanalysis [C] . Dale E. Newbury Microscopy Society of America annual meeting . 2002

机译：低压电压微显分：替代的高分辨率策略耐药性 - 电压微分分析
5. Microanalysis of Larger Metallurgical Molecules [D] . Hoque, Mohammad Mozammel. 2019

机译：较大冶金分子的微分分析
6. Distribution of calcium and other elements in cryosectioned Bacillus cereus T spores determined by high-resolution scanning electron probe x-ray microanalysis. [O] . M Stewart, A P Somlyo, A V Somlyo, 1980

机译：通过高分辨率扫描电子探针X射线显微分析确定了冷冻切片的蜡状芽孢杆菌T孢子中钙和其他元素的分布。
7. Quantitative Microanalysis with high Spatial Resolution: Application of FEG-DTEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steet [O] . Williams, D.B., Watanabe, M. and Burke, M.G. 2001

机译：高空间分辨率的定量微量分析：FEG-DTEm XEDs微量分析在辐照低合金钢板复杂微观结构表征中的应用

Low-Overvoltage Microanalysis: an Alternative High Resolution Strategy toLow-Voltage Microanalysis

著录项

相似文献

相关主题

期刊订阅