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An Assessment of Parallel Connected Silicon Carbide based Electronic Switches

机译:平行连接的基于碳化硅的电子开关的评估

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In this paper, an analysis of the behavior of an electronic switch using SiC-MOSFET semiconductors connected in parallel to be able to raise the working power of the electronic switch is presented. In regards to detect any problems of parallel operation of SiC-MOSFET, the current's switching waveforms of each device and their corresponding sum were detailed observed in through experimental implementations in a bidirectional switch. Source current of the parallel SiC-MOSFET with separate gate driver, drain current of those with separate gate driver, and drain current of one with single gate driver were examined. Even though two heat sinks were separated and switching frequency was 156 kHz, the temperature of the two SiC-MOSFET was 36°C in ambient temperature of 25°C exhibiting excellent thermal stability. Switching waveforms of drain current of the parallel SiC-MOSFET with single gate driver gave the best results.
机译:本文介绍了使用并联连接的SiC-MOSFET半导体的电子开关的行为分析,以便能够提高电子开关的工作电力。关于检测SiC-MOSFET的并联操作的任何问题,通过双向开关中的实验实施方式详细观察每个设备的电流切换波形及其相应的总和。通过单独的栅极驱动器的并联SiC-MOSFET的源电流,检查具有单独栅极驱动器的漏极电流,以及带单个栅极驱动器的漏极电流。即使分离两个散热器和开关频率为156 kHz,两个SiC-MOSFET的温度为36°C,环境温度为25°C,表现出优异的热稳定性。具有单个栅极驱动器的并联SiC-MOSFET的漏极电流的切换波形,得到了最佳效果。

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