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Improved X-ray CCD Response at Very Low X-ray Energies

机译:在非常低的X射线能量下改进的X射线CCD响应

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We report laboratory measurements of the response of a back-illuminated, X-ray photon-counting charge-coupled device at X-ray energies between 80 and 500 eV. The detector tested, which is similar to one currently in orbit aboard the Suzaku X-ray Imaging Spectrometer, has been treated with the chemisorption charging process developed by Lesser and colleagues. We report energy scale linearity and spectral resolution measurements in this energy band, which spans the silicon L_(Ⅱ,Ⅲ) absorption edge, and demonstrate useful spectral resolution at energies as low as 83 eV with our single-read-per-pixel system. We discuss the factors currently limiting device performance and briefly consider the challenges of exploiting this capability in future astronomical instruments.
机译:我们报告了在80和500eV之间的X射线能量的反光X射线计数电荷耦合器件的响应的实验室测量。测试的检测器类似于当前在轨道上的轨道上的轨道X射线成像光谱仪,已经通过较小的和同事开发的化学吸收充电过程处理。我们在该能带中报告能量尺度线性和光谱分辨率测量,其跨越硅L_(Ⅱ,Ⅲ)的吸收边缘,并用我们的单像素系统的单像素系统展示了低至83eV的能量的有用光谱分辨率。我们讨论目前限制了设备性能的因素,并简要考虑在未来天文仪器中利用这种能力的挑战。

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