A MEASURING SYSTEM FOR FAULT DETECTION VIA OSCILLATION

摘要

A method and the test and measuring system for fault detection (FD) in electronic analog circuits, based on the modified oscillation-test approach, are presented. For FD purpose the circuit under test (CUT) is forced to oscillation, which parameters are monitored. Existing faults cause deviations of measured parameters, or result in the loss of oscillation. The novelty of presented approach are technique of converting higher-order circuits to oscillators by feedback structure assignment and the solution of test and measuring system with the automatic digital amplitude control. Microprocessor based system enables not only measurements of the oscillation frequency but also examination of variations in the amplitude step response parameters: rise time and steady-state error, that indicate faulty behaviour of the CUT. The increased quantity of diagnostic information results in the improved fault coverage in comparison with the method exploiting only frequency measurements.