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Impact of solidification velocity on activation of Ga, In, and Al segregated in high Ge content SiGe by UV melt laser anneal

机译:通过UV熔体激光退火对高GE含量SiGe的Ga,IN和Al散,IN和Al在高Ge含量SiGe中的激活对凝固速度的影响

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A possible effect of solidification velocity on activation of surface segregated Ga, In, and Al in high Ge content SiGe after UV melt laser anneal has been discussed. The experiment has shown that this effect depends on the atomic size of the dopants, implying that the solidification velocity may dominate the incorporation of the dopants into active substitutional sites. The control of the solidification velocity may play a key role for improving dopant activation over an equilibrium solid solubility limit.
机译:已经讨论了在UV熔体激光退火之后,凝固速度对表面隔离的Ga,In和Al中的表面的激活的可能效果。实验表明,这种效果取决于掺杂剂的原子大小,这意味着凝固速度可以将掺杂剂的掺入掺入活性的替代位点。对凝固速度的控制可以发挥用于改善平衡固体溶解度极限的掺杂剂活化的关键作用。

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