A new technique of characterization of the intrapixel response of astronomical detectors

摘要

This paper is devoted to the presentation of a new technique of characterization of the Intra-Pixel Sensitivity Variations (IPSVs) of astronomical detectors. The IPSV is the spatial variation of the sensitivity within a pixel and it was demonstrated that this variation can contribute to the instrument global error. Then IPSV has not to be neglected especially in the case of under-sampled instruments for high quality imaging and accurate photometry. The common approaches to measure the IPSV consist in determining the pixel response function (PRF) by scanning an optical probe through the detector. These approaches require high-aperture optics, high precision mechanical devices and are time consuming. The original approach we will present in this paper consists in projecting high-resolution periodic patterns onto the whole sensor without classic optics but using the self-imaging property (the Talbot effect) of a Continuously Self Imaging Grating (CSIG) illuminated by a plane wave. This paper describes the test bench and its design rules. The methodology of the measurement is also presented. Two measurement procedures are available: global and local. In the global procedure, the mean PRF corresponding to the whole Focal Plane Array (FPA) or a sub-area of the FPA is evaluated. The results obtained applying this procedure on e2v CCD 204 are presented and discussed in detail. In the local procedure, a CSIG is moved in front of each pixel and a pixel PRF is reconstructed by resolving the inverse problem. The local procedure is presented and validated by simulations. (Color images and figures in online version)