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Analysis of response of the X-band microstrip antenna array to electromagnetic pulse

机译:X波段微带天线阵列对电磁脉冲的响应分析

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The transient response of the X-band microstrip antenna array illuminated by electromagnetic pulse(EMP) was calculated using FDTD and the proposed conductor edge of singularity solving technology which maintained the high accuracy without lower computation efficiency. The research results showed that the EMP can result in the enough high response voltage in coaxial line which may destroy components in electronic equipment when it incoming along the direction of maximum radiation and polarization matching with the microstrip antenna array. And as polarization mismatch, the response voltage did not cause too big threat. The narrower rising edge or falling edge caused the higher response voltage, and had a bigger threat consequently.
机译:通过电磁脉冲(EMP)照射的X频带微带天线阵列的瞬态响应使用FDTD和奇异性求解技术的所提出的导体边缘计算,其保持高精度而无需较低的计算效率。研究结果表明,EMP可以导致同轴线中的高响应电压,这在沿着与微带天线阵列的最大辐射和偏振匹配的方向进入时,可以破坏电子设备中的部件。并且作为偏振不匹配,响应电压不会引起太大的威胁。较窄的上升边缘或下降沿导致较高的响应电压,并且因此具有更大的威胁。

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