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Application of advnced process control on mixed-product chemical mechanical polishing process

机译:先进过程控制在混合产品化学机械抛光过程中的应用

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This research developed a run-to-run (RtR) process control technique on the mix-product chemical mechanical polishing (CMP) process. The model of the mix-product CMP process was constructed by using analysis of variance and time series analysis. Then, it was transferred to the state space Torm and the extended Kalman filter was employed to estimate the disturbances and update the tool parameter simultaneously. Different methods including time series analysis, double exponentially weighted moving average (D-EWMA), time variant D-EWMA and the proposed method was carried out by CMP real data and the results demonstrated that the performance or the proposed method is better than others.
机译:该研究在混合产品化学机械抛光(CMP)工艺上开发了一种跑步(RTR)过程控制技术。通过使用方差分析和时间序列分析来构建混合物 - 产品CMP工艺的模型。然后,将其转移到状态空间TOM,并采用扩展的卡尔曼滤波器来估计干扰并同时更新刀具参数。通过CMP实际数据进行不同的方法,包括时间序列分析,双指数加权移动平均(D-EWMA),时间变量D-EWMA和所提出的方法,结果表明了性能或所提出的方法比其他方法更好。

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