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Surface plasmon modes and their interactions in multilayer thin-film structures

机译:表面等离子体模式及其在多层薄膜结构中的相互作用

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The propagation of surface plasmons in thin films is important for a number of technologies and has found applications in chemical and biological sensing. There is growing interest in the use of surface plasmons coupled with optical systems for high density photonic devices. While the analysis of the properties of surface plasmons at a metal-dielectric interface is straightforward, it becomes increasingly more difficult as the number of surfaces is increased, as in a multi-layer thin film structure. In this paper we discuss recent developments in mathematical methods for studying the properties of surface plasmons in multi-layer thin film structures of the metal-insulator-metal (MIM) type. The films may consist of a large number of layers creating MIMIM... structures that determine the allowed modes of the surface plasmons. The mathematical formulation is based on a matrix method that yields the eigenvalues (dispersion relation) and the eigenfunctions (mode profiles) associated with the surface plasmons. The method is used to analyze modes in a number of structures. In particular it is shown that modes in structures that contain an optically resonant film can have dispersion curves that cross one another and that changing the resonances in the film can lead to switching of the surface plasmon modes.
机译:表面等离子体在薄膜中的繁殖对于许多技术非常重要,并且发现了化学和生物传感的应用。在使用与高密度光子器件的光学系统的表面等离子体的使用具有日益感兴趣的兴趣。虽然在金属介质界面处的表面等离子体的性质分析是直的,但随着表面的数量增加,如在多层薄膜结构中,它变得越来越困难。在本文中,我们讨论了用于研究金属 - 绝缘金属(MIM)型多层薄膜结构中表面等离子体性能的数学方法的最新发展。薄膜可以由大量的层组成,该层产生了模拟的结构,该结构确定表面等离子体的允许模式。数学制剂基于矩阵方法,其产生与表面等离子体相关联的特征值(色散关系)和特征函数(模式轮廓)。该方法用于分析许多结构中的模式。特别地,示出了含有光学谐振膜的结构中的模式可以具有彼此交叉的分散曲线并且改变膜中的谐振可以导致表面等离子体模式的切换。

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