首页> 外文会议>World Tribology Congress >LOW FRICTION ACHIEVED USING REPULSIVE VAN DER WAALS FORCES: A NANOTRIBOLOGY STUDY WITH COLLOID PROBE AFM
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LOW FRICTION ACHIEVED USING REPULSIVE VAN DER WAALS FORCES: A NANOTRIBOLOGY STUDY WITH COLLOID PROBE AFM

机译:利用令人厌恶的范德华力量实现的低摩擦力:用胶体探头AFM进行纳米型研究

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We show that extremely low friction can be achieved with the use of a divergent, pre-contact "surface force"-the repulsive, so called van der Waals force. In almost all cases this force is attractive, but for certain combinations of materials it manifests repulsively and at short separations (of the order of molecular distances) the load bearing capacity provided by the force is large. We have used the Atomic Force Microscope (AFM) in colloid probe mode to measure the friction between sub-microscopic contacts in the presence of such a force and have achieved a friction coefficient of the order of 0.0002.
机译:我们表明,使用发散,预接触的“表面力” - 排斥,所谓的van der waals力,可以实现极低的摩擦力。在几乎所有情况下,这种力都很有吸引力,但对于某些材料组合,它表现出屈服性,并且在分子距离的短处理(分子距离的顺序)中,由力提供的承载能力大。我们使用了胶体探针模式的原子力显微镜(AFM)来测量这种力存在下亚微观触点之间的摩擦,并且已经实现了0.0002的摩擦系数。

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