Analysis of trap distribution for smectic liquid crystals using time of flight spectroscopy

摘要

We analyzed the experimental time-of-flight data for photoinjected holes in two smectic liquid crystals, the first consisting of a phenylnaphthalene derivative 8PNPO12, and the second consisting of a biphenyl derivative 6OBP6. We fit the time of flight transients for different electric field strengths to a multiple trapping model (MTM). From these fits we determined the distribution of trap depths, under the assumption that (ⅰ) linear response is valid, and (ⅱ) the trap-release rates are independent of field.