Investigation of degradation mechanisms of oragnic light-emitting diodes under an electrical stress

摘要

We studied degradation mechanisms of organic light-emitting diodes under a continuous electrical stress. We found that the mobility of organic layers is nearly unchanged while the electric current decreases more than two orders of magnitude under a constant voltage bias. The result suggests that the carrier transport properties of bulk organic films are quite stable but the organic/electrode interfaces are mainly responsible for the device degradation.