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Water Stress Corrosion in Bonded Structures

机译:粘结结构中的水应力腐蚀

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Direct bonding is now a well-known technique to join two flat surfaces without any additional material. This technique is used in many applications and especially in SOI (Silicon-On-Insulator) elaboration or in some backside imager manufacturing processes which are now almost in mass production. Direct bonding mechanism study is then very important in order to clearly understand this bonding behavior. Especially in the case of silicon or silicon dioxide hydrophilic surface, the role of water is essential. Water could lead to lots of different reactions at the bonding interface and especially the water stress corrosion could play an important role in the direct bonding mechanism.
机译:直接粘接现在是一种众所周知的技术,用于加入两个没有任何额外材料的平面。该技术用于许多应用中,特别是在SOI(绝缘体上)阐述或在现在几乎在批量生产中的一些背面成像器制造过程中。直接粘合机制研究是非常重要的,以便清楚地理解这种粘合行为。特别是在二氧化硅或二氧化硅亲水表面的情况下,水的作用至关重要。水可能导致粘合界面的许多不同的反应,特别是水分应激腐蚀可能在直接粘合机制中发挥重要作用。

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