首页> 外文会议>Conference on interferometry: Techniques and analysis >Fringe spacing in white light interferometry
【24h】

Fringe spacing in white light interferometry

机译:白色光干涉测量中的边缘间距

获取原文

摘要

Interference microscopes use quasi-monochromatic, broad band, and white light illumination for surface topography measurement. Fringe spacing for uasi-monochromatic illumination changes with the numerical aperture of system, and these changes have been previously examined by others. In this article we compare changes in fringe spacing for white light and broad band illumination for objectives with a numerical aperture of 0.13 and 0.55. We find that white light fringe spacing changes with tilt of the object much faster than for monochromatic illumination. We also investigate the influence of reference mirror tilt on changes in white light fringe spacing.
机译:干扰显微镜使用用于表面形貌测量的准单色,宽带和白色光照射。用于Uasi-单色照明的条纹间距随着系统的数值孔径而变化,先前已经被其他人检查过这些变化。在本文中,我们对白色光线的条纹间距和宽带照明的变化与0.13和0.55的数值孔径的宽带照明。我们发现白光边缘间距与物体的倾斜度快,比单色照明更快。我们还研究参考镜倾斜对白光条纹间距的变化的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号