Raman Scattering investigations of CdS thin films grown by Thermal Evaporation

摘要

In this study, CdS thin films deposited by thermal evaporation on the ITO coated glass substrate have been annealed at 450oC for constant times of 30 minutes at varied excitation powers in order to study the effects on the optical characteristics of CdS thin films. Raman and Photoluminescence measurements were made at room temperatures for the annealed samples and a comparison was carried out with as grown sample at different laser powers. Results indicate an improved crystalline quality for the annealed films as compared to the as grown samples. Further a shift in the band gap was observed for annealed films with decreased excitation powers.