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Broad hand microwave probe for nondestructive test of dielectric coatings

机译:用于介电涂层无损检测的宽手动微波探头

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We report on nondestructive characterization of Thermal Barrier Coatings (TBC: YSZ/MCrAlY/Ni-superalloy). To test TBC we have employed the method of electromagnetic defectoscopy described in the patent [1]. We have modernized this method by applying microwave probe instead of RF coil: an open-ended coaxial probe was used to measure complex permittivity of dielectric material ε = ε' + ε". The probe is basically a coaxial transmission line with an open end put into tight mechanical contact with the sample under test. Complex permittivity of the sample material was calculated from the coefficient of microwave reflection from the probe-sample interface. Using the probe the complex permittivity can be measured in a wide frequency range. Such broadband spectroscopy enables detection of foreign phase inclusions, delamination of dielectric layer and cracks on the ceramics/metal substrate interface, etc. Microwave probe enables noninvasive and nondestructive test of both small-area and large-area surfaces. Defects in the ceramic layer under test are revealed as anomalies of the dielectric permittivity on the background of almost constant ε, which is characteristic for the rest of the material.
机译:我们报告了热阻挡涂层的非破坏性表征(TBC:YSZ / McRaly / Ni-Superalloy)。为了测试TBC,我们使用专利[1]中描述的电磁缺陷检查方法。我们通过应用微波探针而不是RF线圈进行了现代化的方法:使用开口结束的同轴探针来测量介电材料的复杂介电常数ε=ε'+ε“。探头基本上是一个带开口端的同轴传输线与正在测试的样品中的紧密机械接触。样品材料的复杂介电常数由探针样品界面的微波反射系数计算。使用探头可以在宽频范围内测量复介电常数。这种宽带光谱能够实现异物夹杂物的检测,介电层的分层和陶瓷/金属衬底界面上的裂缝等。微波探针使得对小面积和大面积表面的非侵入性和无损检测。陶瓷层的缺陷被揭示为几乎恒定ε的背景上的介电学介电常数的异常,其是其余材料的特征。

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