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Characterization of Defects in Electron Irradiated 6H-SiC by Positron Lifetime and Electron Spin Resonance

机译:正电子寿命和电子自旋共振电子照射6H-SiC缺陷的表征

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Defects in 6H-SiC produced by 3 MeV electron irradiation were studied using positron lifetime and electron spin resonance (ESR) with annealing experiment. From the positron lifetime measurements, vacancy-type defects were found to be generated by irradiation. Three ESR signals were observed. Comparing with the positron lifetime data, the esr centers were related to vacancy defects. Structural models and annealing kinetics are discussed for defects produced by irradiation.
机译:采用正电子寿命和电子自旋共振(ESR)研究了6H-SiC在6H-SiC中产生的缺陷用退火实验研究。从正电子寿命测量,发现空位型缺陷通过辐射产生。观察到三个ESR信号。与正电子寿命数据相比,ESR中心与空位缺陷有关。讨论了辐照产生的缺陷的结构模型和退火动力学。

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