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FormFactor introduces an integrated process for wafer-level packaging, burn-in test, and module level assembly

机译:FormFactor引入了晶圆级包装,烧坏测试和模块级装配的集成过程

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FormFactor is developing a wafer-level back-end solution, encompassing wafer-level package, wafer-level burn-in, high speed test at the wafer-level, and assembly to printed circuit boards. The primary element is a MicroSpring contact, a resilient, compliant spring. The MicroSpring contacts have proven to be durable in Probe Card applications, and robust in LGA production sockets. Early reliability testing is showing that the MicroSpring contact is establishing new benchmarks for CSPs, both atpackage and at board level. All of the elements of the wafer-level process have been demonstrated, and further pre-production characterization and qualification is continuing.
机译:FormFactor正在开发晶圆级后端解决方案,包括晶片级封装,晶片级烧伤,在晶片级的高速测试,以及装配到印刷电路板。主元件是微粒触点,弹性,柔顺的弹簧。 MicroSpring触点已被证明在探针卡应用中耐用,并且在LGA生产插座中稳健。早期可靠性测试表明,MicroSpring联系人正在为CSPS,ATPackage和板级建立新的基准。已经证明了晶片级过程的所有元素,并继续进行了预先生产的表征和资格。

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