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Grain boundary effects on hydrogen-induced blisters initiation in pure iron

机译:纯铁致氢诱导水疱引发的晶界影响

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Hydrogen blistering is known as one type of hydrogen damage to induce the formation ofsubsurface planar cavities and cracks, which shorten the fatigue life of metallic materials.Nevertheless, due to the limitation of the technique, the initaition location of the blisters are stillunclear. Grain boundaries (GBs), as the most common trapping sites of hydrogen, were sensitiveto the generation of hydrogen blisters. Small cavities and holes, which were believed to be thestarting of the blisters, were found on GBs in many pure materials. Type of GBs is decisive when itcomes to the sensitivity to hydrogen embrittlement. In this paper, The effects of GBs on theinitiation of the blisters are studied by synchrotron polychromatic X-ray Laue nano-diffraction (XND)method combing the Molecular dynamics simulations. XND is a cutting-edge technique thatprovides accurate nformations on orientation, mirco strain/stress, dislocation density etc. Thefocused beam size can be as small as 80×80nm~2. Due to the high penetration feature of the X-ray,the technique is non-destructive to the sample and requires little on the sureface conditions of thesamples, which makes it perfect to the study of the blisters.In this paper, GBs effects on initiation of hydrogen-induced blisters in pure iron were investigatedusing XND. Random GBs were more susceptible to blistering than coincidence site lattice GBs. Acomplex deformation mechanism and high strain levels were observed around random GBs.Molecular dynamics simulations revealed that hydrogen induces high stress/strain on random GBs,causing localized plastic deformation. A possible mechanism of blisters formation is proposed.Hydrogen atoms trapped by the free volume of random GBs recombine into hydrogen molecules,causing localized stress and plasticity, enlarging the excess volume of the GBs to eventuallynucleate blisters.
机译:氢气吸塑被称为一种类型的氢气损伤,以诱导形成 地下平面空腔和裂缝,缩短了金属材料的疲劳寿命。 尽管如此,由于该技术的限制,水泡的初始位置仍然存在 不清楚。作为最常见的氢气捕获部位的晶粒界限(GBS)是敏感的 到氢气的产生。小腔和孔,被认为是 在许多纯材料的GBS上发现了水泡。 GBS的类型是决定性的 达到氢脆的敏感性。在本文中,GB对GB对的影响 通过同步多色X射线Laue纳米衍射(XND)研究了水疱的启动 方法梳理分子动力学模拟。 XND是一种尖端技术 提供准确的方向,MIRCO应变/应力,位错密度等。该 聚焦光束尺寸可以小于80×80nm〜2。由于X射线的高穿透特征, 该技术对样品不破坏性,但需要几乎不需要符合Sureface条件 样品,这使得它非常适合对水疱的研究。 本文研究了GBS对纯铁致氢诱导水疱引发的影响 使用xnd。随机GBS比符合符合刚性位点格GB更容易受到漂亮的影响。一种 在随机GBS周围观察到复杂的变形机制和高应变水平。 分子动力学模拟显示氢气在随机GBS上引起高应力/菌株, 导致局部塑性变形。提出了一种可能的水泡形成机制。 被自由体积的随机GBS重组成氢分子的氢原子, 导致局部应力和可塑性,扩大GBS的过量体积最终 核心水泡。

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