Investigation on VLSIs' input ports susceptibility to conducted RFinterference

摘要

The usual susceptibility test performed to check an ICs hardnessto conducted and radiated radiofrequency (RF) interference does not seemto be useful when studying IC subcircuit input ports. Susceptibilitymeasurements carried out directly on the chip surface are mandatory. Thework has been aimed at the development of a susceptibility test benchdesigned on the basis of the “PIN injection method”, inorder to carry out “on chip” measurements by using theelectron beam testing (EBT) probe station system. Measurements have beenperformed in the input pad of a VLSI circuit (CMOS (0.7 μm)) forinterference with carrier frequency in the range 20 MHz-1 GHz andavailable power level up to 15 dBm