Design of Electronic Devices Stress Testing System with Charging Line Based Impulse Generator

摘要

Systems based on the charging line are one of the most suitable designs of electromagnetic pulses generators for building up test lines of electronic devices. Such cable-based charging lines in combine with fast switching triggers will allow generating electromagnetic impulses with nanosecond duration and rising time at a level of 1 nanosecond. The amplitude of impulse directly depends from the cable charge voltage and equal half of its value. Therefore, control and setting up of generator with such parameters are quite difficult task. In present work this problem was solved by design microcontroller based electronic devices stress testing system, which includes control and power supply units for charging line generator. By using microcontroller as a control center we concentrate in one device the possibility to charge line in the range from 40 to 400 V with steps no more than 1 V, realize like manual start of a single pulse and automatic controlled regime with series of impulses and ensures necessary for safety indications of device working regimes.