Photoresponse and X-ray response of Cd1-xZnxTe thick polycrystalline films

摘要

In this work photoresponse and X-ray response of hard radiation detector prototypes based on Cd_1-xZn_xTe thick polycrystalline films were evaluated. In order to estimate the crystalline quality of the films the investigations of surface morphology and structural properties were carried out. It has been proven that the light excitation of the visible range can be applied for evaluation of the detector properties of CZT polycrystalline films for their further use as radiation detectors.