Best Practices for Describing Digital Serial Buses and Bus Test Operations Using IEEE 1671 ATML and IEEE 1641 Signal and Test Definition

摘要

The recently published revisions of IEEE Std 1671.3 ATML UUT Description and IEEE Std 1671.1 ATML Test Description contain many new features that support the description of serial bus testing. This paper proposes a set of best practices for using these new features to describe UUT serial buses and bus test operations. The application of these best practices produces UUT and test descriptions that are simple, accurate, and maintainable for the lifetime of the UUT.