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Crevice Elimination and Stitch Integrity Improvement on Leaded Packages Thru Shifted Lead Neck Design

机译:铅剥离和缝合完整性改善铅封装通过偏移颈部设计

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The intensive drive of zero delamination for highest reliability has been one of the top priorities of packaging an integrated circuit. Delamination has been a constant challenge to the lead forming process due to the high stress induced to the lead and mold interface - this phenomenon can result to a very minute separation between the mold compound and leadframe (crevice). This very tiny opening can potentially serve as external path for moisture which can result to oxidation of adjacent stitches which can lead to package reliability concerns. This paper will focus on an innovative lead design to further improve reliability on leaded packages thru crevice elimination. The design incorporates angular lead termination from the package vs conventional perpendicular lead formation. This angular and shifting lead termination reduces the forming force applied directly to the lead during forming process, reducing risk of crevice, thus improving overall package reliability.
机译:为最高可靠性的零分层的密集驱动是封装集成电路的最重要优先级之一。 由于引起的引线和模具界面引起的高应力,分层对引线成形过程一直是持续挑战 - 这种现象可以导致模具化合物和引线框架(缝隙)之间的非常微小的分离。 这种非常微小的开口可能用作水分的外部路径,这可能导致相邻缝线的氧化,这可以导致包装可靠性问题。 本文将专注于创新的铅设计,以进一步提高铅包的可靠性通过缝隙消除。 该设计包括来自封装的角度引线终端Vs常规垂直铅形成。 这种角度和变速的引线终端可在成型过程中直接施加到引线的成形力,降低缝隙的风险,从而提高整体包装可靠性。

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