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Quantitative Measurement of MR Cortical Atrophy: MR Brain Surface Intensity Model(BSIM)and Group and Individual Cortical Thinning Studies

机译:MR皮质萎缩的定量测量:MR脑表面强度模型(BSIM)以及组和单个皮质变薄研究

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Alzheimer's disease(AD)is caused by pathological changes including cortical thinning occurring throughout the brain. Traditional methods for assessing cortical thickness are challenged by the sub-millimeter accuracy required for clinical conditions and the convoluted nature of brain surface. Furthermore, there is a significant overlap of gray and white matter intensities. A novel Brain Surface Intensity Model(BSIM)has been developed for use as a potential imaging biomarker for neurodegenerative diseases. BSIM technique extracts MR intensity profiles perpendicular to a mathematically defined gray matter iso-intensity layer(GMIIL)at predefined reference points, fits that profile to BSIM, and computes cortical thickness. A 3D visualization tool has been developed to evaluate intensity extraction and model calculation. 29 normal subjects aged between 70 to 80 years from ADNI database were used to generate normal references and measure individual Z-score cortical thinning. 30 age-matched AD subjects were used to study thinning patterns. Significant cortical thinning(p<0.0001)was found for AD group. 95% confidence interval of the cortical thinning in AD patients was from 0.17 to 0.23 mm. The cortical thinning of the AD patients showed distinct features that differentiate AD patients from normal controls. The thickness measurements of 29 normal controls were validated by comparing with results from literature(p = 0.94). BSIM technique avoids complicated 3D segmentation of brain gray and white matters, and simplifies the thickness calculation. Moreover, it is less affected by the image noise, inhomogeneity, partial volume effects, and the intensity overlap of the white and gray matters.
机译:阿尔茨海默病的疾病(AD)是由病理变化引起的,包括在整个大脑中发生皮质细化。用于评估皮质厚度的传统方法受到临床条件所需的亚毫米精度和脑表面的旋转性质所需的亚毫米精度挑战。此外,灰色和白质强度存在显着重叠。开发了一种新颖的脑表面强度模型(BSIM),以用作神经变性疾病的潜在成像生物标志物。 BSIM技术在预定参考点处提取垂直于数学定义的灰质异形ISO - 强度层(Gmiil)的MR强度分布,适用于BSIM的轮廓,并计算皮质厚度。已经开发了一种3D可视化工具来评估强度提取和模型计算。在ADNI数据库到70至80年之间的29个正常科目用于生成正常的参考并测量单个Z-Score皮质稀疏。使用30次匹配的AD受试者来研究稀疏模式。发现广告组的显着皮质细化(P <0.0001)。 AD患者皮质细化的95%置信间隔为0.17至0.23mm。 AD患者的皮质稀疏显示出不同的特征,使AD患者免受正常对照。通过与文献结果进行比较验证了29例正常对照的厚度测量(P = 0.94)。 BSIM技术避免了脑灰色和白色的复杂3D分割,并简化了厚度计算。此外,通过图像噪声,不均匀性,部分体积效应和白色和灰色物质的强度重叠的影响较小。

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