Standard test bench for optimization and characterization of combinational circuits

摘要

Choice of a combinational circuit among large number of circuits having same functionality has been always a complex and time consuming task for digital designers. Different circuits (where they are initially proposed) were optimized using different techniques and objectives. Moreover there merits vary as per optimization methodology and technique variations. Hence every time when there is a requirement of particular functionality circuit, choosing best one amongst available circuits requires re-characterization. The paper presents a thorough investigation of existing optimization techniques while presenting their merits and demerits over each other. Based on same, the paper proposes a standard test bench for optimization and characterization of combinational circuits. Finally using the proposed methodology a combinational circuitry has been successfully characterized.