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PROCESSING STRATEGIES AND RELIABILITY OF 0.4mm PITCH CSPs

机译:0.4mm间距CSP的加工策略和可靠性

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Interest in using fine pitch (0.4mm pitch and below) CSPs has increased greatly in recent years due to the growth of the portable, hand held electronics and due to miniaturization trends in consumer and industrial electronics markets. Other products driving fine pitch package assembly include RF applications and system in a package (SiP) assemblies. This paper will discuss surface mount assembly strategies and subsequent reliability of 0.4mm pitch CSP package assemblies.The data in this paper will highlight a number of significant yield and reliability factors that are affected by the design of the board layout, as well as printing, placement, and reflow processes. Board design recommendations are presented to reduce board trace failures common in drop testing. It will also show how CSP assembly drop reliability can be further improved with simple design changes. A generalized board level design enhancement mechanism presented by T.Y. Tee et al. will be reviewed in the context of the "Rocker Effect" failure mechanism to help explain the benefits of two major design enhancements. For the processing factors, it will be shown that certain design and manufacturing parameters can have a significant effect upon total process defects. Both stencil printing and dip fluxing processes are reviewed for the 0.4mm CSP assembly, with yield and assembly characterization of these two processes to be explained. Finally, material selection and reflow parameters also play an important role in the assembly yield of fine pitch packages and will be reviewed. This paper will lastly focus on the reliability of 0.4mm CSP assemblies including thermal cycle reliability and drop test performance.
机译:近年来,由于便携式手持电子产品的增长以及消费类电子产品和工业电子产品市场的小型化趋势,使用细间距(0.4mm间距及以下)CSP的兴趣大大增加。其他驱动小间距封装组装的产品包括RF应用和系统封装(SiP)组装。本文将讨论表面贴装组装策略以及0.4mm间距CSP封装组件的后续可靠性。本文中的数据将重点介绍许多重要的良率和可靠性因素,这些因素受电路板布局设计以及印刷,贴装和回流工艺。提出了电路板设计建议,以减少跌落测试中常见的电路板走线故障。它还将展示如何通过简单的设计更改来进一步提高CSP组件跌落可靠性。 T.Y.提出的通用板级设计增强机制Tee等。我们将在“罗克效应”失效机制的背景下进行回顾,以帮助解释两项主要设计改进的好处。对于加工因素,将显示某些设计和制造参数可能对整个工艺缺陷产生重大影响。审查了0.4mm CSP组件的模版印刷和浸涂助焊剂工艺,并解释了这两种工艺的成品率和组件特性。最后,材料选择和回流参数在小间距封装的组装良率中也起着重要作用,并将对此进行审查。本文最后将重点放在0.4mm CSP组件的可靠性上,包括热循环可靠性和跌落测试性能。

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