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An Analytical Method to Quantify Silica Nanoparticles Accumulated on the Surface of Polymer Nanocomposites Exposed to UV Radiation

机译:定量分析暴露在紫外线下的聚合物纳米复合材料表面积聚的二氧化硅纳米颗粒的分析方法

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Three films containing different mass fractions (0 %, 5 % and 10 %) of silica (SiO_2) nanoparticles have been subjected to controlled degradation conditions at specified humidity, temperature, and ultraviolet (UV) radiation doses over a period of 59 days. The mass fraction of extracted nanosilica is measured by inductively coupled plasma-optical emission spectroscopy (ICP-OES). Results show the presence of nanosilica on the films containing 5 % and 10 % nanosilica, regardless of the exposure conditions. However, after UV exposure for 59 days, the mass fraction of nanosilica in the extracted solutions increase by factors of 2.3 and 1.7 for the 5 % and 10 % nanosilica films, respectively. Measurement variability is lower for the 10 % nanosilica films, likely due to the larger mass of nanosilica that is released. Results of this study will assist in establishing a reliable and sensitive method for measuring the release rate of silica nanoparticles from UV-irradiated polymer nanocomposites.
机译:在指定的湿度,温度和紫外线(UV)辐射剂量下,对含有不同质量分数(0%,5%和10%)的二氧化硅(SiO_2)纳米颗粒的三层膜进行了受控的降解条件,历时59天。提取的纳米二氧化硅的质量分数通过电感耦合等离子体发射光谱法(ICP-OES)进行测量。结果表明,不管曝光条件如何,在含有5%和10%纳米二氧化硅的薄膜上都存在纳米二氧化硅。但是,在紫外线暴露59天后,对于5%和10%的纳米二氧化硅薄膜,萃取溶液中纳米二氧化硅的质量分数分别增加了2.3和1.7倍。 10%纳米二氧化硅薄膜的测量变异性较低,这可能是由于释放的纳米二氧化硅质量较大。这项研究的结果将有助于建立一种可靠,灵敏的方法来测量二氧化硅纳米颗粒从紫外线照射的聚合物纳米复合材料中的释放速率。

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