SOC of Measuring the Sub-pixel Edge of Linear CCD Based on Wavelet Transform

摘要

In order to compute the width of defects in plastic film accurately,is presented in this paper a new image fusion method is proposed. This approach firstly determines the image edge positions based on canny criteria and in combination with wavelet transform algorithm. Then use the wavelet transform algorithm to devide the image's edge location in subpixel level,thus detecting the sub-pixel edge. This method which is more accurate than former single straight line fitting method can enhance edge and remove noise effectively,and experiments of one-dimension image show that this method is correct and effective.