Controlled Modification of Erbium Lifetime in Silicon Dioxide Film with Chromium or Titanium Coatings

摘要

We report systematic measurements of the lifetime of the 1.54 μm transition of erbium implanted at different energies in SiO_2 films coated with titanium or chromium. The lifetime shows a strong reduction up to a factor of 20 with decreasing distance between the erbium and the metal coating. Our experiments combined with rigorous theoretical modeling demonstrate that a high degree of control over the radiative properties of erbium can be achieved in erbium-implanted materials.