首页> 外文会议>国际照明委员会(CIE)第26届大会 >Validation of cie averaged led intensity measurement by comparing results of the photometric and spectroradiometric methods with different traceabilities
【24h】

Validation of cie averaged led intensity measurement by comparing results of the photometric and spectroradiometric methods with different traceabilities

机译:通过比较具有不同可追溯性的光度法和光谱辐射法的结果来验证ci平均led强度测量

获取原文

摘要

We compare two different methods for measuring the averaged LED intensity defined by CIE. One is the photometric method using a photometer, whose luminous responsivity is traceable to the detector-based candela scale of KRISS. The other is the spectroradiometric method using a spectroradiometer, which is calibrated with a spectral irradiance standard lamp supplied by NIST. From the agreement of the results between these two methods with different traceabilities, we validate our measurement capability for the CIE averaged LED intensity.
机译:我们比较了两种不同的方法来测量CIE定义的平均LED强度。一种是使用光度计的光度法,该光度计的光响应度可追溯到KRISS的基于检测器的坎德拉光栅。另一种是使用光谱辐射计的光谱辐射法,该光谱仪由NIST提供的光谱辐照度标准灯进行了校准。根据这两种方法之间具有不同可追溯性的结果的一致性,我们验证了CIE平均LED强度的测量能力。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号