Fourier imaging microscopy of light-emitting hybrid perovskite nanostructures

摘要

Hybrid perovskites has recently emerged as a promising material for flatland optoelectronic and nanophotonic applications. In this report, we present our initial findings about probing the microscopic emission process using back focal plane spectroscopy. Our results highlight how the growth, induced defects and morphological heterogeneity modify the photoluminescence emission in hybrid perovskite nanostructured thin films. Furthermore, we explain our findings within the framework of back focal plane imaging principles.