Understanding Fundamental Material Limitations to Enable Advanced Detector Design

摘要

This work presents the activities of the Center for Semiconductor Modelling in the area of infrared imaging devices. We outline a methodology that enables the study of large scale infrared detector arrays to quantify their optical and electrical performance. Furthermore, we present an approach to investigate the quantum mechanical transport properties of superlattice based detectors that are an emerging technology with potential applications both in commercial and defense system.