SEU simulation by fault injection in PSoC device: Preliminary results

摘要

In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.