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Partial Discharge Behavior of Epoxy/paper Insulated Tubular Busbars with Artificial Defects

机译:带有人工缺陷的环氧树脂/纸绝缘管状母线的局部放电行为

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Epoxy/paper insulated materials, with the merits of great insulation performance, excellent mechanical strength, are widely used in tubular busbars playing an important role in safe and steady operation of national grid. In this work, the partial discharge (PD) in epoxy/paper insulated tubular busbars with two types of artificial defects and different aging time were measured. The aging voltage imposed on the samples was 18 kV, and the aging temperature was 428 K. PD of samples at varied aging stage were measured. Sample with defect of cavity and metallic impurity (sample B) showed larger apparent charge magnitude, compared with the sample with defect of cavity (sample A). For example, the measured largest apparent charges of sample B was 8337 pC, much larger than the value of 2266 pC measured in sample A when aged for 700h. In addition, the value of PD inception voltage of sample A was fluctuated around the 16 kV, while PD inception voltage of sample B varied from 10 kV to 8.4 kV. And we analyzed the results in the article. To figure out the influence of defects on the PD activity, MATLAB Simulink tools were used to simulate the PD of samples with different defects. The results showed that the defect of cavity and metallic impurity discharged more severely than the defect of cavity. Moreover, finite element analysis (FEA) method was applied to obtain the electrical field distribution, which revealed that the defect of cavity and metallic impurity caused local electrical field distortion whose maximal value was 1.8 times of the defect of cavity.
机译:环氧/纸绝缘材料具有绝缘性能好,机械强度高等优点,被广泛用于管状母线中,对国家电网的安全稳定运行起着重要的作用。在这项工作中,测量了具有两种人造缺陷和不同老化时间的环氧树脂/纸绝缘管状母线的局部放电(PD)。施加在样品上的老化电压为18 kV,老化温度为428K。测量了在不同老化阶段的样品的PD。与具有空洞缺陷的样品(样品A)相比,具有空洞和金属杂质的样品(样品B)显示出更大的表观电荷量。例如,样品B测得的最大表观电荷为8337 pC,远大于样品A老化700h时测得的2266 pC的值。另外,样品A的PD起始电压在16kV附近波动,而样品B的PD起始电压在10kV至8.4kV之间变化。我们在文章中分析了结果。为了找出缺陷对PD活性的影响,使用了MATLAB Simulink工具来模拟具有不同缺陷的样品的PD。结果表明,空洞和金属杂质的排放比空洞的缺陷更为严重。此外,采用有限元分析(FEA)方法获得电场分布,结果表明,腔体缺陷和金属杂质引起局部电场畸变,最大值为腔体缺陷的1.8倍。

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