首页> 外文会议>Annual IEEE Applied Power Electronics Conference and Exposition >Active hot spot cooling of GaN transistors with electric field enhanced jumping droplet condensation
【24h】

Active hot spot cooling of GaN transistors with electric field enhanced jumping droplet condensation

机译:通过电场增强GaN晶体管的主动热点冷却,从而增强跳跃液滴凝结

获取原文

摘要

Mitigating heat generated by hot spots inside of power electronic devices is a formidable obstacle to further increases in power density. This paper presents the first demonstration of active cooling for hot spots via jumping droplet condensation. This newly discovered phase change cooling mechanism comprises 10 to 100 μm sized droplets leaping from a cold superhydrophobic surface onto a hot GaN transistor and efficiently transferring heat via evaporation. After discussing how electric fields can enhance this process, observations from cooling GaN transistors with this method are outlined. Experimental measurements demonstrate increased cooling rates and steerable heat transfer through the application of electric fields.
机译:减轻由功率电子设备内部的热点所产生的热量是进一步提高功率密度的巨大障碍。本文介绍了通过跳跃液滴凝结对热点进行主动冷却的第一个演示。这种新发现的相变冷却机制包括10至100μm大小的液滴,这些液滴从冷的超疏水表面跃迁到热的GaN晶体管上,并通过蒸发有效地传递热量。在讨论了电场如何增强此过程之后,概述了使用这种方法冷却GaN晶体管所得到的观察结果。实验测量表明,通过施加电场,可以提高冷却速度并控制热传递。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号