A study on the evaluation method of glass frit paste for crystalline silicon solar cells

摘要

Conductive paste degrades the solar cell performance due to the metallization. Silver crystallites at the interface may shunt the p-n junction, which degrades the cell performance. Besides, it is conceivable that glass frit itself should not effectively damage silicon, but there is no clear evidence for the proof. In this study, the “floating contact method” proposed by R. Hoenig is used to evaluate the effects of glass frit by making the floating contacts with the glass frit. It is conclude that glass frit itself causes shunts and increases the saturation current, which corresponds carrier recombination beneath the glass frit contacts.