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Short-circuit behavior of series-connected high-voltage IGBTs

机译:串联高压IGBT的短路行为

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In operation of series-connected IGBTs a voltage balancing is necessary, during short circuits it is even more important. Within this paper the behavior of series-connected IGBTs and diodes during the short-circuit type 2 and 3 is analyzed. The dv/dt during the short circuit is determined by one of two equivalent circuit capacitances. One is the plasma capacitance and the second one is the Miller capacitance. Depending on the gate-drive unit the dv/dt is intrinsic, when the gate current is sufficiently high, and the plasma capacitance determines the desaturation process during short circuit. Or the gate current controls via the Miller-capacitance feedback the dv/dt. The results are obtained with the help of measurement on 3.3 kV-IGBTs.
机译:在串联连接的IGBT的操作中,电压平衡是必要的,而在短路期间则更为重要。在本文中,分析了在短路类型2和3期间串联连接的IGBT和二极管的行为。短路期间的dv / dt由两个等效电路电容之一确定。一个是等离子体电容,第二个是米勒电容。取决于栅极驱动单元,当栅极电流足够高时,dv / dt是固有的,而等离子体电容决定了短路期间的去饱和过程。或通过米勒电容控制栅极电流反馈dv / dt。通过在3.3 kV-IGBT上进行测量可以获得结果。

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