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A Double-Data- Rate 2 (DDR2) Interface Phase-Change Memory with 533MB/s Read -Write Data Rate and 37.5ns Access Latency for Memory-Type Storage Class Memory Applications

机译:双倍数据速率2(DDR2)接口相变存储器,具有533MB / s的读写数据速率和37.5ns的访问延迟,适用于存储器类型的存储类存储器应用

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摘要

For the first time, by using a novel multiple individual bank sensing/writing and a memory bank interleave design, we demonstrate a double date rate 2 (DDR2) DRAM like interface phase-change memory (PCM) for M-type storage class memory applications . The write and read bandwidth is equal to 533MB/s, and the random read latency is 37.5ns, while the write latency is 11.25ns supporting a random write cycle of 176.7ns. In addition, a record high switching speed of 128ns with good resistance distribution is demonstrated with a super-fast Set material.
机译:首次,通过使用新颖的多个独立存储体感测/写入和存储体交错设计,我们展示了用于接口接口相变存储器(PCM)的双倍速率2(DDR2)DRAM,适用于M型存储类存储应用。写入和读取带宽等于533MB / s,随机读取延迟为37.5ns,而写入延迟为11.25ns,支持176.7ns的随机写入周期。此外,采用超快Set材料证明了创纪录的128ns高开关速度,具有良好的电阻分布。

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