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A Photoinduced Electrostatic Doping Effect in Carbon Nanotube Field-Effect Transistors

机译:碳纳米管场效应晶体管中的光导静电掺杂效果

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A photoinduced electrostatic doping effect based on bottom-gate carbon nanotube field-effect transistors (CNT-FETs) with poly (urea-urethane) as dielectric is reported for the first time. The transistors exhibit significant changes in their transfer characteristics as a result of low-intensity visible light illumination (~6.2 m W cm−2), mainly including the increase in the order of magnitude of the on-current and a shift in threshold voltage. The photoinduced phenomenon can be explained by a photoinduced electron trapping model, in which the photogenerated electrons in the Si-gate are trapped by the polymer dielectric layer at a negative gate voltage and induces more hole carriers in the semiconducting carbon nanotubes (S-CNTs) channel.
机译:首次报道基于底栅碳纳米管场效应晶体管(CNT-FET)作为电介质的底栅碳纳米管场效应晶体管(CNT-FET)的光渗出的静电掺杂效应。 由于低强度可见光照明(〜6.2米W厘米),晶体管表现出其传递特性的显着变化(〜6.2米 -2 ),主要包括在电流上的幅度和阈值电压的偏移量增加。 光诱导的现象可以通过光诱导的电子捕获模型来解释,其中Si栅极中的光发生电子在负栅极电压下被聚合物介电层捕获,并在半导体碳纳米管(S-CNT)中诱导更多的孔载体 渠道。

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